作者: Hiroshi Kano , Satoshi Kawata
DOI: 10.1364/AO.33.005166
关键词: Absorption spectroscopy 、 Thin film 、 Surface plasmon 、 Sensitivity (control systems) 、 Total internal reflection 、 Materials science 、 Absorption (electromagnetic radiation) 、 Prism 、 Optics 、 Resonance
摘要: A method to enhance the absorption sensitivity of a sample by utilizing surface-field enhancement with surface-plasmon resonance is proposed. The experimental setup based on configuration for attenuated total internal reflection (ATR) but thin metal film deposed substrate prism. mechanism responsible analyzed theoretically; best thickness have attain optimum numerically calculated. Experimental results are shown in which proposed compared conventional ATR exhibits measurement. sensor applications this technique also discussed.