作者: J.R. Laghari
DOI: 10.1109/14.237741
关键词: Composite material 、 Life test 、 Dielectric 、 Forensic engineering 、 Accelerated aging 、 Dielectric thin films 、 Radiation 、 Materials science 、 Breakdown voltage 、 Weibull distribution 、 Thermal
摘要: The effects of electrical, thermal and radiation stresses, singularly or simultaneously, on dielectric films are reviewed. types accelerated aging under these stresses the statistical methods used to evaluate experimental data for life, including two-parameter Weibull log-normal distributions, described briefly. life models currently discussed. Recent complex electrical/thermal/radiation described. >