Complex electrical thermal and radiation aging of dielectric films

作者: J.R. Laghari

DOI: 10.1109/14.237741

关键词: Composite materialLife testDielectricForensic engineeringAccelerated agingDielectric thin filmsRadiationMaterials scienceBreakdown voltageWeibull distributionThermal

摘要: The effects of electrical, thermal and radiation stresses, singularly or simultaneously, on dielectric films are reviewed. types accelerated aging under these stresses the statistical methods used to evaluate experimental data for life, including two-parameter Weibull log-normal distributions, described briefly. life models currently discussed. Recent complex electrical/thermal/radiation described. >

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