Reliability potential of silicone molding compounds for LED application

作者: Yue Shao , Yu-chou Shih , Frank G. Shi

DOI: 10.4071/ISOM-TP34

关键词:

摘要: As the development of light emitting devices (LEDs), integrate circuits (ICs) and concentration photovoltaic (CPV) modules towards higher density, packaging materials are facing challenges withstand with heat generation high energy. Epoxy molding compound (EMC) is latest technology for LED solar cell package to replace PPA PCT. However, it well known that thermal radiation resistance epoxy limited. Recently, silicone based composites attracting attention as ideal because they insensible energy density good UV heat. both have reliability issues during long-term service at temperature Thermal degradation reflector will largely affect their reflectance contribution a output efficiency. Therefore, very essential evaluate performance SMC EMC reflecting materials. Aging under multip...

参考文章(11)
Joseph Mazzochette, Edmar Amaya, Light emitting diode arrays with improved light extraction ,(2005)
Etienne Moulin, Ulrich Wilhelm Paetzold, Hilde Siekmann, Janine Worbs, Andreas Bauer, Reinhard Carius, Study of thin-film silicon solar cell back reflectors and potential of detached reflectors Energy Procedia. ,vol. 10, pp. 106- 110 ,(2011) , 10.1016/J.EGYPRO.2011.10.161
Yi-Cheng Hsu, Yu-Kuan Lin, Ming-Hung Chen, Chun-Chin Tsai, Jao-Hwa Kuang, Sheng-Bang Huang, Hung-Lieh Hu, Yeh-I Su, Wood-Hi Cheng, Failure Mechanisms Associated With Lens Shape of High-Power LED Modules in Aging Test IEEE Transactions on Electron Devices. ,vol. 55, pp. 689- 694 ,(2008) , 10.1109/TED.2007.911905
Hao Guo, Hongjun Chen, Xiong Zhang, Peiyuan Zhang, Jianjun Liu, Honggang Liu, Yiping Cui, High-performance GaN-based light-emitting diodes on patterned sapphire substrate with a novel hybrid Ag mirror and atomic layer deposition-TiO2/Al2O3 distributed Bragg reflector backside reflector Optical Engineering. ,vol. 52, pp. 063402- 063402 ,(2013) , 10.1117/1.OE.52.6.063402
Eduardo Nogueira, Manuel Vázquez, Carlos Algora, Accelerated Life Testing in Epoxy Packaged High Luminosity Light Emitting Diodes Journal of Electronic Packaging. ,vol. 133, pp. 034501- ,(2011) , 10.1115/1.4004659
J.R. Laghari, Complex electrical thermal and radiation aging of dielectric films IEEE Transactions on Electrical Insulation. ,vol. 28, pp. 777- 788 ,(1993) , 10.1109/14.237741
M. D. Kempe, M. Kilkenny, T. J. Moricone, J. Z. Zhang, Accelerated stress testing of hydrocarbon-based encapsulants for medium-concentration CPV applications 2009 34th IEEE Photovoltaic Specialists Conference (PVSC). pp. 001826- 001831 ,(2009) , 10.1109/PVSC.2009.5411508
Yeong-Her Lin, Jiun Pyng You, Yuan-Chang Lin, Nguyen T. Tran, Frank G. Shi, Development of High-Performance Optical Silicone for the Packaging of High-Power LEDs IEEE Transactions on Components and Packaging Technologies. ,vol. 33, pp. 761- 766 ,(2010) , 10.1109/TCAPT.2010.2046488
R. N. Kumar, Lim Yoke Keem, Ng Chee Mang, Abusamah Abubakar, Ultraviolet radiation curable epoxy resin encapsulant for light emitting diodes Journal of Applied Polymer Science. ,vol. 100, pp. 1048- 1056 ,(2006) , 10.1002/APP.23189