Glancing-angle extended x-ray-absorption fine structure and reflectivity studies of interfacial regions

摘要: Glancing-angle extended x-ray-absorption fine structure (EXAFS) and x-ray reflectivity measurements have been made for a Au surface several Cu/Al interfaces. The samples consisted of 1000 A\r{} Al on Cu, the demonstrate potential these techniques determining interface morphology. In particular, distinct differences were observed in both EXAFS signals prepared under different conditions. information obtained is compared with by transmission electron microscopy, Rutherford backscattering, Auger sputter profiling, excellent agreement found. glancing-angle are distorted anomalous dispersion effects simple analytic correction scheme presented. This has tested data found to work well entire range incident angles. For interfaces corrections allowed quantitative analysis Cu-Al bonding at interface, substantial difference UHV non-UHV (${10}^{\mathrm{\ensuremath{-}}6}$ Torr) These offer some unique characteristics more standard studies.