Tungsten‐carbon multilayer composition and the effects of annealing: A glancing angle extended x‐ray absorption fine structure study

作者: G. M. Lamble , S. M. Heald , D. E. Sayers , E. Ziegler , P. J. Viccaro

DOI: 10.1063/1.343308

关键词:

摘要: Results are presented from a glancing angle extended x‐ray absorption fine structure study to investigate the of W/C multilayers and effects moderate annealing. There is evidence considerable interlayer mixing prior any heat treatment. It found that after annealing 350 °C for several hours, drastic changes can occur in structural environment W atoms, with minimal reflectivity sample. extensive formation W2C depending on thickness ratio. Identification this carbide as product unambiguous. Above critical thickness, begins grow its bcc form within layer, it prepared. This layer unaffected by process. The presence carbon shown stabilize amorphous state inhibits when ratio small.

参考文章(8)
E. Ziegler, Y. Lepetre, Ivan K. Schuller, E. Spiller, Stability of multilayers for synchrotron optics Applied Physics Letters. ,vol. 48, pp. 1354- 1356 ,(1986) , 10.1063/1.96907
P. A. Lee, J. B. Pendry, Theory of the extended x-ray absorption fine structure Physical Review B. ,vol. 11, pp. 2795- 2811 ,(1975) , 10.1103/PHYSREVB.11.2795
S. M. Heald, H. Chen, J. M. Tranquada, Glancing-angle extended x-ray-absorption fine structure and reflectivity studies of interfacial regions Physical Review B. ,vol. 38, pp. 1016- 1026 ,(1988) , 10.1103/PHYSREVB.38.1016
Y. Lepêtre, E. Ziegler, Ivan K. Schuller, R. Rivoira, Anomalous expansion of tungsten‐carbon multilayers used in x‐ray optics Journal of Applied Physics. ,vol. 60, pp. 2301- 2303 ,(1986) , 10.1063/1.337192
D. Roux, A. Rolland, P. Renucci, J.P. Petrakian, AES sputtering depth profile analysis of C/W layered synthetic microstructures Applied Surface Science. ,vol. 28, pp. 93- 102 ,(1987) , 10.1016/0169-4332(87)90056-0
S J Gurman, N Binsted, I Ross, A rapid, exact curved-wave theory for EXAFS calculations Journal of Physics C: Solid State Physics. ,vol. 17, pp. 143- 151 ,(1984) , 10.1088/0022-3719/17/1/019
S. M. Heald, J. M. Tranquada, Standing‐wave‐assisted extended x‐ray absorption fine‐structure study of a Ni‐Ti multilayer Journal of Applied Physics. ,vol. 65, pp. 290- 293 ,(1989) , 10.1063/1.342538
Leon Golub, Eberhard Spiller, R. J. Bartlett, M. P. Hockaday, D. R. Kania, W. J. Trela, R. Tatchyn, X-ray tests of multilayer coated optics Applied Optics. ,vol. 23, pp. 3529- 3533 ,(1984) , 10.1364/AO.23.003529