Scanning Probe Spectroscopy of WS2/Graphene Van Der Waals Heterostructures.
作者： Franco Dinelli , Filippo Fabbri , Stiven Forti , Camilla Coletti , Oleg V. Kolosov
DOI: 10.3390/NANO10122494
关键词: Spectroscopy 、 Materials science 、 Optoelectronics 、 Scanning probe microscopy 、 Scanning electron microscope 、 Ultrasonic force microscopy 、 Graphene 、 Cantilever 、 Electrostatic force microscope 、 Nanoscopic scale
摘要: In this paper, we present a study of tungsten disulfide (WS2) two-dimensional (2D) crystals, grown on epitaxial Graphene. particular, have employed scanning electron microscopy (SEM) and µRaman spectroscopy combined with multifunctional probe (SPM), operating in peak force–quantitative nano mechanical (PF-QNM), ultrasonic force (UFM) electrostatic (EFM) modes. This comparative approach provides wealth useful complementary information allows one to cross-analyze the nanoscale morphological, mechanical, properties 2D heterostructures analyzed. Herein, show that PF-QNM can accurately map surface properties, such as morphology adhesion, UFM is exceptionally sensitive broader range elastic helping uncover subsurface features located at buried interfaces. All these data be correlated local obtained via EFM mapping potential, through cantilever response first harmonic, dielectric permittivity, second harmonic. conclusion, combining multi-parametric SPM SEM helps identify single WS2/Graphene/SiC analyzed, demonstrating powerful tool-set for investigation materials stacks, building block new advanced nano-devices.
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