Focus: Pulses Give New Force to Probe Microscopy
作者： Michael Schirber
DOI:
关键词: Piezoresponse force microscopy 、 Conductive atomic force microscopy 、 Scanning probe microscopy 、 Nanotechnology 、 Non-contact atomic force microscopy 、 Atomic force acoustic microscopy 、 Kelvin probe force microscope 、 Optics 、 Materials science 、 Scanning voltage microscopy 、 Scanning capacitance microscopy
摘要: A new technique in atomic force microscopy more accurately measures the electrostatic between probe and surface.
参考文章(3)
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