Quantitative Atomic Force Microscopy with Carbon Monoxide Terminated Tips

作者: Zhixiang Sun , Mark P. Boneschanscher , Ingmar Swart , Daniël Vanmaekelbergh , Peter Liljeroth

DOI: 10.1103/PHYSREVLETT.106.046104

关键词:

摘要: Noncontact atomic force microscopy (AFM) has recently progressed tremendously in achieving resolution imaging through the use of small oscillation amplitudes and well-defined modification tip apex. In particular, it been shown that picking up simple inorganic molecules (such as CO) by AFM leads to a apex enhanced image resolution. Here, we same approach study three-dimensional intermolecular interaction potential between two focus on implications using molecule-modified tips for spectroscopy experiments. The flexibility CO at complicates measurement energy molecules. Our work establishes physical limits measuring interactions with scanning probes.

参考文章(28)
Jens K. Nørskov, Lars G.M. Pettersson, Anders Nilsson, Chemical bonding at surfaces and interfaces Elsevier. ,(2008)
Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, S. Morita, Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy Science. ,vol. 322, pp. 413- 417 ,(2008) , 10.1126/SCIENCE.1160601
Oscar Custance, Ruben Perez, Seizo Morita, Atomic force microscopy as a tool for atom manipulation Nature Nanotechnology. ,vol. 4, pp. 803- 810 ,(2009) , 10.1038/NNANO.2009.347
L. Gross, F. Mohn, N. Moll, P. Liljeroth, G. Meyer, The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy Science. ,vol. 325, pp. 1110- 1114 ,(2009) , 10.1126/SCIENCE.1176210
S. Hembacher, F. J. Giessibl, J. Mannhart, C. F. Quate, Revealing the hidden atom in graphite by low-temperature atomic force microscopy Proceedings of the National Academy of Sciences of the United States of America. ,vol. 100, pp. 12539- 12542 ,(2003) , 10.1073/PNAS.2134173100
Boris J. Albers, Todd C. Schwendemann, Mehmet Z. Baykara, Nicolas Pilet, Marcus Liebmann, Eric I. Altman, Udo D. Schwarz, Three-dimensional imaging of short-range chemical forces with picometre resolution Nature Nanotechnology. ,vol. 4, pp. 307- 310 ,(2009) , 10.1038/NNANO.2009.57
Stefan Hembacher, Franz J Giessibl, Jochen Mannhart, Force microscopy with light-atom probes. Science. ,vol. 305, pp. 380- 383 ,(2004) , 10.1126/SCIENCE.1099730
Franz J. Giessibl, Advances in atomic force microscopy Reviews of Modern Physics. ,vol. 75, pp. 949- 983 ,(2003) , 10.1103/REVMODPHYS.75.949
M. Ternes, C. P. Lutz, C. F. Hirjibehedin, F. J. Giessibl, A. J. Heinrich, The force needed to move an atom on a surface. Science. ,vol. 319, pp. 1066- 1069 ,(2008) , 10.1126/SCIENCE.1150288