Investigating inhomogeneous electronic properties of radial junction solar cells using correlative microscopy
作者： Martin Müller , Matěj Hývl , Markus Kratzer , Christian Teichert , Soumyadeep Misra
关键词: Kelvin probe force microscope 、 Microscope 、 Right triangle 、 Scanning electron microscope 、 Microscopy 、 Nanowire 、 Optics 、 Conductive atomic force microscopy 、 Position (vector) 、 Materials science
摘要: Solar cells with radial junctions based on silicon nanowires were investigated using correlative microscopy in order to determine the nature and origin of previously reported inhomogeneity their electronic properties. For correlating various techniques, we have prepared sets three Vickers type nanoindents arranged a right triangle 20 µm sides as marks local frame reference. Due shape indents (squares 4 clear diagonals) position can be located high precision by microscopes. This makes it possible correlate results from scanning electron microscopy, Kelvin probe force conductive atomic techniques same place sample, down individual nanowires, obtaining new information about inhomogeneity. Using AFM analyzed growth process step find origins (photo)current variations.
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