The 2/sup nd/ order analysis of I/sub DDQ/ test data
作者： S. Li , K. Zhang , J.-C. Lo
DOI: 10.1109/DFTVS.2000.887178
关键词: Electronic engineering 、 Order (group theory) 、 Test data 、 Very-large-scale integration 、 Algorithm 、 Engineering 、 CMOS 、 Signature (logic)
摘要: The proposed 2/sup nd/ order current signature technique considers both the 1/sup st/ mean and variance information to provide a more robust effective means of die selection. We examined I/sub DDQ/ testing data from SEMATECH by compared results those traditional single threshold delta techniques. found that analysis may enable way implement testing. In particular, clear distinction can be made between defected defect-free dies. dies identified delta-I/sub are quite similar for data. However, future deep sub-micron VLSI where value vary significantly, has definite advantage being robust.
sci-hub.se 参考文章(14)
Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao, I DDQ testing: A review Journal of Electronic Testing. ,vol. 3, pp. 291- 303 ,(1992) , 10.1007/BF00135333
C. Thibeault, L. Boisvert, Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results international test conference. pp. 1019- 1026 ,(1998) , 10.1109/TEST.1998.743299
B. Vinnakota, Wanli Jiang, Dechang Sun, Process-tolerant test with energy consumption ratio international test conference. pp. 1027- 1036 ,(1998) , 10.1109/TEST.1998.743300
C. Thibeault, An histogram based procedure for current testing of active defects international test conference. pp. 714- 723 ,(1999) , 10.1109/TEST.1999.805800
Anne Gattiker, Current Signatures for Production Testing IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96). pp. 25- ,(1996)
P. Nigh, W. Needham, K. Butler, P. Maxwell, R. Aitken, An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing vlsi test symposium. pp. 459- 464 ,(1997) , 10.1109/VTEST.1997.600334
Jien-Chung Lo, Online current testing IEEE Design & Test of Computers. ,vol. 15, pp. 49- 56 ,(1998) , 10.1109/54.735927
A. Ferre, J. Figueras, I/sub DDQ/ characterization in submicron CMOS international test conference. pp. 136- 145 ,(1997) , 10.1109/TEST.1997.639606
P. Maxwell, P. O'Neill, R. Aitken, R. Dudley, N. Jaarsma, M. Quach, D. Wiseman, Current ratios: a self-scaling technique for production I/sub DDQ/ testing international test conference. pp. 1148- 1156 ,(1999) , 10.1109/TEST.1999.805803
A.E. Gattiker, W. Maly, Current signatures: application international test conference. pp. 156- 165 ,(1997) , 10.1109/TEST.1997.639608