Process-tolerant test with energy consumption ratio
作者： B. Vinnakota , Wanli Jiang , Dechang Sun
关键词:
摘要: We develop a new technique for fault detection based on metric, the energy consumption ratio (ECR). ECR-based test can detect faults, such as redundant that escape with other techniques. Though ECR is metric supply current, an analog parameter, it remarkably tolerant to impact of process variations. The quality demonstrated through extensive simulation offered by MOSIS. also present generation algorithm technique. When applied benchmark circuits, this reliably detects large fraction combinationally faults in them.
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