作者: Michele Celebrano , Paolo Biagioni , Margherita Zavelani-Rossi , Dario Polli , Massimiliano Labardi
DOI: 10.1063/1.3095556
关键词: Near-field scanning optical microscope 、 Nonlinear optics 、 Optics 、 Optical fiber 、 Laser power scaling 、 Near and far field 、 Laser 、 Femtosecond 、 Materials science 、 Near-field optics
摘要: We describe an aperture scanning near-field optical microscope (SNOM) using cantilevered hollow pyramid probes coupled to femtosecond laser pulses. Such probes, with respect tapered fibers, present higher throughput and power damage threshold, as well greater mechanical robustness. In addition, they preserve pulse duration polarization in the near field. The instrument can operate two configurations: illumination mode, which SNOM probe is used excite nonlinear response field, collection where it collects emission following far-field excitation. application examples highlighting capability of system observe nanostructured metal surfaces (gold projection patterns gold nanorods) sub-100-nm spatial resolution.