作者: Witold Kula , Chyu-Jiuh Torng , Ru-Ying Tong , Cheng T. Horng
DOI:
关键词: Materials science 、 Layer (electronics) 、 Speed measurement 、 Electrical engineering 、 Magnetization 、 One half 、 Damping constant 、 Optoelectronics 、 Magnetoresistive random-access memory 、 Amorphous solid 、 Stack (abstract data type)
摘要: A STT-RAM MTJ that minimizes spin-transfer magnetization switching current is disclosed. The has a MgO tunnel barrier layer formed with natural oxidation process to achieve low RA and Fe or Fe/CoFeB/Fe free which provides lower intrinsic damping constant than CoFeB layer. Fe, FeB, when AP1 pinned in MRAM stack annealed at 360°C high dR/R (TMR) > 100% substantial improvement read margin TMR/Rp_cov = 20. High speed measurement of 100 nm x 200 oval MTJs shown Jc0 for one half an amorphous Co40Fe40B20