High performance MTJ element for conventional MRAM and for STT-RAM and a method for making the same

作者: Witold Kula , Chyu-Jiuh Torng , Ru-Ying Tong , Cheng T. Horng

DOI:

关键词: Materials scienceLayer (electronics)Speed measurementElectrical engineeringMagnetizationOne halfDamping constantOptoelectronicsMagnetoresistive random-access memoryAmorphous solidStack (abstract data type)

摘要: A STT-RAM MTJ that minimizes spin-transfer magnetization switching current is disclosed. The has a MgO tunnel barrier layer formed with natural oxidation process to achieve low RA and Fe or Fe/CoFeB/Fe free which provides lower intrinsic damping constant than CoFeB layer. Fe, FeB, when AP1 pinned in MRAM stack annealed at 360°C high dR/R (TMR) > 100% substantial improvement read margin TMR/Rp_cov = 20. High speed measurement of 100 nm x 200 oval MTJs shown Jc0 for one half an amorphous Co40Fe40B20

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