Improvement of a dynamic scanning force microscope for highest resolution imaging in ultrahigh vacuum.
作者： S. Torbrügge , J. Lübbe , L. Tröger , M. Cranney , T. Eguchi
DOI: 10.1063/1.2964119
关键词: Materials science 、 Image resolution 、 Optoelectronics 、 Optical fiber 、 Light-emitting diode 、 Preamplifier 、 Vacuum chamber 、 Laser diode 、 Resolution (electron density) 、 Optics 、 Semiconductor laser theory
摘要: We report on a modification of commercial scanning force microscope (Omicron UHV AFM/STM) operated in noncontact mode (NC-AFM) at room temperature ultrahigh vacuum yielding decrease the spectral noise density from 2757 to 272 fm/Hz. The major part reduction is achieved by an exchange originally installed light emitting diode laser placed outside vacuum, where coupled into chamber via optical fiber. setup further improved use preamplifiers having bandpass characteristics tailored cantilever resonance frequency. enhanced signal ratio demonstrated comparison atomic resolution images CeO2(111) obtained before and after modification.
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sci-hub.se 参考文章(25)
Clemens Barth, Michael Reichling, Imaging the atomic arrangements on the high-temperature reconstructed α-Al 2 O 3 (0001) surface Nature. ,vol. 414, pp. 54- 57 ,(2001) , 10.1038/35102031
S Gritschneder, M Reichling, Structural elements of CeO2(111) surfaces Nanotechnology. ,vol. 18, pp. 044024- ,(2007) , 10.1088/0957-4484/18/4/044024
Eric R.I. Abraham, Eric A. Cornell, Teflon feedthrough for coupling optical fibers into ultrahigh vacuum systems Applied Optics. ,vol. 37, pp. 1762- 1763 ,(1998) , 10.1364/AO.37.001762
S Gritschneder, Y Iwasawa, M Reichling, Strong adhesion of water to CeO2(111) Nanotechnology. ,vol. 18, pp. 044025- ,(2007) , 10.1088/0957-4484/18/4/044025
M. Abe, Y. Sugimoto, O. Custance, S. Morita, Room-temperature reproducible spatial force spectroscopy using atom-tracking technique Applied Physics Letters. ,vol. 87, pp. 173503- ,(2005) , 10.1063/1.2108112
M Reichling, S Hirth, F Ostendorf, Lateral manipulation of atomic size defects on the CaF2(111) surface Nanotechnology. ,vol. 17, ,(2006) , 10.1088/0957-4484/17/7/S08
M Fendrich, T Kunstmann, D Paulkowski, R Möller, Molecular resolution in dynamic force microscopy: topography and dissipation for weakly interacting systems Nanotechnology. ,vol. 18, pp. 084004- ,(2007) , 10.1088/0957-4484/18/8/084004
Toyoaki Eguchi, Y. Hasegawa, High resolution atomic force microscopic imaging of the Si(111)-(7 x 7) surface: contribution of short-range force to the images. Physical Review Letters. ,vol. 89, pp. 266105- ,(2002) , 10.1103/PHYSREVLETT.89.266105
Takeshi Fukuma, Masayuki Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada, Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy Review of Scientific Instruments. ,vol. 76, pp. 053704- ,(2005) , 10.1063/1.1896938
Yoshiaki Sugimoto, Pablo Pou, Masayuki Abe, Pavel Jelinek, Rubén Pérez, Seizo Morita, Óscar Custance, Chemical identification of individual surface atoms by atomic force microscopy Nature. ,vol. 446, pp. 64- 67 ,(2007) , 10.1038/NATURE05530