MeV-atomic-ion-induced surface tracks in Langmuir-Blodgett films and L-valine crystals studied by scanning force microscopy
作者： C.T. Reimann , J. Kopniczky , E. Wistus , J. Eriksson , P. Håkansson
DOI: 10.1016/0168-1176(95)04317-9
关键词: Spectroscopy 、 Chemistry 、 Reflection (mathematics) 、 Sputtering 、 Scanning Force Microscopy 、 Analytical chemistry 、 Langmuir–Blodgett film 、 Thermal 、 Impact crater 、 Ion
摘要: To acquire new information about the electronic sputtering of organic samples, we have obtained tapping mode scanning force microscopy images craters induced by individual surface-grazing 48.6 MeV 79Br ions incident on Langmuir-Blodgett (LB) and l-valine surfaces. Crater sizes depended somewhat parameters mode. For LB films, crater widths were 24–34 nm, while depths ranged from 5 to 8 nm. crystals, 33 39 4–7 We discuss observations in framework pressure pulse evaporative thermal spike models.
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