作者: T. Tai , K. Wasa , J. Kim , T. Kouzu , M. Matsuoka
DOI: 10.1080/10584587.2013.780136
关键词: Sputtering 、 Materials science 、 Analytical chemistry 、 Raman spectroscopy 、 Thin film 、 Sputter deposition 、 Dielectric 、 Quenching
摘要: Single-c-domain/single-crystal PZT thin films grown by rf magnetron sputtering on SrRuO3/Pt/MgO substrates was investigated Raman spectroscopy. The spectroscopy measurement revealed that the sputter deposited film has high quality and highly c domain oriented. In addition, local strain configuration in sputtered from surface to substrates. These stresses were discussed with dielectric property.