Single scattering curved wave XAFS code

作者: J.J. Rehr , R.C. Albers , J.Mustre de Leon

DOI: 10.1016/0921-4526(89)90332-3

关键词: OpticsCode (cryptography)ScatteringX-ray absorption fine structurePhysics

摘要:

参考文章(3)
Dan Lu, J. J. Rehr, Inelastic processes in extended x-ray-absorption fine structure. Physical Review B. ,vol. 37, pp. 6126- 6133 ,(1988) , 10.1103/PHYSREVB.37.6126
J. J. Rehr, R. C. Albers, C. R. Natoli, E. A. Stern, New high-energy approximation for x-ray-absorption near-edge structure Physical Review B. ,vol. 34, pp. 4350- 4353 ,(1986) , 10.1103/PHYSREVB.34.4350
Boon-Keng Teo, P. A. Lee, Ab initio calculations of amplitude and phase functions for extended x-ray absorption fine structure spectroscopy Journal of the American Chemical Society. ,vol. 101, pp. 2815- 2832 ,(1979) , 10.1021/JA00505A003