Contact test circuit
作者： Anthony R. Bonaccio , Howard J. Leighton
DOI:
关键词: Voltage 、 Phase (waves) 、 Electrical engineering 、 Test (assessment) 、 Engineering 、 Functional testing 、 Diode 、 Test probe 、 Input device 、 Device under test
摘要: A method and apparatus for contact testing a plurality of devices under test, either sequentially or simultaneously. In first test phase it is determined whether the probe to each shorted most negative rail. second has made proper contact, ESD diodes on are functional. both phases pulse generated tester bus applied by probe. positive rail device grounded; in positive. The connected tester. phases, upon termination pulse, restored voltage which dependent condition expected input at contact. measured accordance with logic determines Data signals functional can be through an isolating driver preserves test.
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