Contact testing device
作者： Vivian C. Watts
DOI:
关键词:
摘要: For detecting whether a probe (P) is in contact with an electrical circuit under test (U), capacitance measurement means (M) measures the between and reference (G), without contacting circuit. The measured stored control circuitry (T) then value position which it assumed to be circuit, comparing capacitance.
lens.org 参考文章(7)
Robert J. Russell, Automatic test equipment test probe contact isolation detection method ,(1980)
Ronald Morino, Robert P. Burr, Raymond J. Keogh, James C. Christophersen, James B. Burr, Jonathan C. Crowell, Method and apparatus for testing of electrical interconnection networks ,(1984)
Vivian Charles Watts, Testing electrical circuits ,(1989)
Hisahiko Etoh, Shin Tozawa, Tsutomu Miyazaki, Method of testing semiconductor devices using a probe card ,(1986)
Dan F. Irick, Roger F. Zollinger, Method and apparatus for capacitance testing printed circuit boards ,(1978)
Fu-Chieh Hsu, Tsen-Shau Yang, Ger-Chih Chou, Contact sensing for integrated circuit testing ,(1990)
Alexander D. Pitegoff, Analyzing electrical circuit boards ,(1978)