作者: Robert H. Dennard , Dominic P. Spampinato
DOI:
关键词: Transistor 、 Electrical engineering 、 Integrated circuit 、 Polysilicon gate 、 Lithography 、 Insulator (electricity) 、 Electrode 、 Field-effect transistor 、 Materials science 、 Optoelectronics 、 Fabrication
摘要: A field effect transistor (FET) wherein the insulator is nonrecessed with respect to source and drain regions, sides of polysilicon gate electrode are self-aligned nonconductive neither overlap nor underlap insulator. The lateral dimensions location correlate directly channel region FET. fabrication technique employed comprises delineating lithographic patterns twice in same layer; whereby first pattern delineates regions be used for sources drains, next forms regions.