X-ray measuring apparatus
作者： Masakazu Okabe , Rika Baba , Ken Ueda
DOI:
关键词: Detector 、 Optics 、 X-ray 、 Wide field 、 Physics 、 Electromagnetic shielding 、 Sensitivity (electronics) 、 High spatial resolution 、 Data processing 、 Position (vector)
摘要: The present invention provides an x-ray measuring apparatus for diagnosis having high spatial resolution and sensitivity, which includes: source emitting x-rays from focal spot; detector in a plurality of sensing elements each sensitive part blind surrounding the are arranged two-dimensionally; data processing means collecting output signals performing processing; anti-scatter grid disposed between spot with predetermined distance position transmitting member shielding alternately first direction. A pitch direction linear images projected on surface by is set to be substantially integral multiple two or larger arrangement In such manner, moire-free image wide field view obtained.
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