X-ray measuring instrument

摘要: An X-ray measuring instrument in which an object under examination is irradiated with X-rays, measurement data on the detected, a filter for adjusting amount of transmitted X-rays disposed between source and object, relative position to varied, acquired computed. The subjected logarithm transform acquire projection data, absorbed corresponding determined. thickness computed by using predetermined formula X-rays. A correction coefficient from determined, multiplied determined coefficient. restructure-computed obtain three-dimensional image.