Abundance of Excited Ions in O+ and O2+ Ion Beams

摘要: A method has been developed to determine the fraction of excited ions present in an ion beam formed using various energies E8of electrons source. The determination is made ∼20 μsec after formation so that only long‐lived states remain beam, as usual experiments. consists attenuating a gas‐filled reaction chamber, where different suffer attenuations. Results have obtained for O2+ and O+ beams. In each case one state appears be important: For f this was found 0.22, 0.30, 0.33 E8 values 25 eV, 50 100 respectively. O2+, 0.27 E8 = 50 eV 0.30 E8 = 100 eV. use these results illustrated by combining them with crossed‐beam measurements charge transfer separately cross sections ground excited‐state O2+.