Manufacturing method of metal oxide semiconductor device

作者: Ping Liu , Qingtian Ma , Haiyang Zhang

DOI:

关键词: Layer (electronics)Semiconductor deviceOxide semiconductorMetalPolycrystalline siliconEtching (microfabrication)OxideSemiconductorOptoelectronicsMaterials science

摘要: The invention discloses a manufacturing method for semiconductor device of metal oxide, which comprises: forming dielectric layer on the underlay; polycrystalline silicon said layer; hard mask and patterning it; etching by to form grid; protective grid surface; method; eliminating layer. forms sidewall in side wall grid, has function separating corrosive liquid from thus avoid bottleneck.

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