Effect of Zr addition on ZnSnO thin-film transistors using a solution process

作者: Woong Hee Jeong , Hyun Jae Kim , You Seung Rim , Dong Lim Kim

DOI: 10.1063/1.3524514

关键词: Solution processThin-film transistorLayer (electronics)Threshold voltageTransistorStandard electrode potentialElectron mobilityOptoelectronicsMaterials scienceWide-bandgap semiconductor

摘要: … The high-binding energy ( O III ) at 532.8 eV was attributed to the presence of loosely bound oxygen on the surface of the thin film due to specific species (eg, – CO 3 or adsorbed H 2 O …

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