作者: Woong Hee Jeong , Hyun Jae Kim , You Seung Rim , Dong Lim Kim
DOI: 10.1063/1.3524514
关键词: Solution process 、 Thin-film transistor 、 Layer (electronics) 、 Threshold voltage 、 Transistor 、 Standard electrode potential 、 Electron mobility 、 Optoelectronics 、 Materials science 、 Wide-bandgap semiconductor
摘要: … The high-binding energy ( O III ) at 532.8 eV was attributed to the presence of loosely bound oxygen on the surface of the thin film due to specific species (eg, – CO 3 or adsorbed H 2 O …