Exponentially tapered dielectric loaded probe for accurate near field measurements
作者： Zhengpeng Wang , Xianzhong Chen , Weilong Wang , Meng Li , Zhiping Li
DOI: 10.1109/EUCAP.2014.6902559
关键词: Dielectric 、 Near and far field 、 Optics 、 Materials science
摘要:
sci-hub.se 参考文章(12)
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