Flash memory device with multiple erase voltage levels

作者: Moo-sung Kim

DOI:

关键词: Cellular arrayFlash memoryElectrical engineeringNon-volatile memoryComputer hardwareVoltageComputer science

摘要: In some embodiments, a string of nonvolatile memory cells may be erased by driving their control gates with erase voltages that have different levels for cells. The divided into two or more groups, and the in each group driven same voltage. another embodiment, device include cell array having groups cells, simultaneously during an operation.

参考文章(15)
Johnny C. Chen, Kazuhiro Kurihara, Tiao-Hua Kuo, Nancy S. Leong, Variable sector size for a high density flash memory device ,(2000)
Vincent Leung, Masaru Yano, Michael S. C. Chung, Shane Charles Hollmer, Binh Quang Le, Pau-Ling Chen, A scheme for page erase and erase verify in a non-volatile memory array ,(1999)
Tomoharu Tanaka, Masaki Momodomi, Yoshihisa Iwata, Koji Sakui, Electrically erasable programmable read-only memory with block-erase function ,(1991)
Nobutsugu Odani, Non-volatile memory circuit ,(2000)