Chemical etching and surface oxidation studies of cadmium zinc telluride radiation detectors
作者： P. Veeramani , S. J. Hinder , M. L. T. Monnier , G. Prekas , A. Lohstroh
DOI: 10.1002/SIA.3146
关键词: Saturation (chemistry) 、 X-ray photoelectron spectroscopy 、 Cadmium zinc telluride 、 Isotropic etching 、 Oxide 、 Surface layer 、 Analytical chemistry 、 Bromine 、 Particle detector 、 Chemistry
摘要: … oxide thickness was determined to be 1.6 ± 1.0 nm.[16] It is clear that the 30% H2O2 solution brings about rapid oxidation … times appear to result in oxide thicknesses similar to that …
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