High-pressure X-ray diffraction study of tungsten diselenide

作者: Emre Selvi , Yanzhang Ma , Resul Aksoy , Atila Ertas , Allen White

DOI: 10.1016/J.JPCS.2006.05.008

关键词: CrystallographyTungsten diselenideTungstenDiffractionDiamond anvil cellX-ray crystallographyAnalytical chemistryPhase (matter)Bulk modulusSynchrotron radiationChemistry

摘要: Abstract Synchrotron X-ray diffraction was used in conjunction with a diamond anvil cell to investigate the properties of tungsten diselenide (WSe2) sample 35.8 GPa at room temperature. By fitting pressure–volume data third-order Birch–Murnaghan equation state, bulk modulus, K0T, WSe2 determined be 72±1 GPa its pressure derivative, K 0 T ′ , being 4.1±0.1. It also found that c-direction hexagonal structure is significantly more compressible than a-direction. No phase transformation clearly observed range our measurements.

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