Electrocrystallization of metallic thin films on different substrates: Effect of operating parameters

作者: Kheer Sagar Maitry

DOI:

关键词: Grain growthMaterials scienceSubstrate (electronics)Deposition (phase transition)GraphiteComposite materialScanning electron microscopeThin filmNucleationMetallurgyCrystallinity

摘要: Thin films are two dimensional layers with a thickness usually in the order of nanometers to microns, which is negligible when compared bulk material. play vital role many prospective fields like energy, mechanical and metallurgical solutions. The current work focuses on grain growth, crystallinity induced stress copper thin synthesized by electrodeposition graphite stainless steel (SS) substrates. Cu film deposition was carried out (i) at constant voltage (0.35V) varying temperature (ii) (room) for each substrate. nucleation growth behavior Graphite studied X-ray diffraction (XRD) Scanning Electron Microscopy (SEM). Induced calculated from Stoney formula surface profilometer data. It observed that case fixed tests, low (10°C) not favorable higher increase bath (18 & 20°C). Similarly, (1.3V) resulted high rate than values (0.7 1.0 V). XRD analysis revealed much better substrate SS may be due crystal structure Stress condition obtained tests trend based Tensile detrimental as compressive nature prevents cracking.

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