作者: Qiqi Hua , Chenfan Yang , Yajie Wang , Tiezheng Lv
DOI: 10.1007/S10854-017-6380-1
关键词: Recombination velocity 、 Etching (microfabrication) 、 Wafer 、 Materials science 、 Solar cell 、 Solar cell efficiency 、 Optoelectronics 、 Quantum efficiency 、 Open-circuit voltage 、 Wetting
摘要: We report a simple way to optimize texturing of multi-crystalline Si (mc-Si) wafer by pre-wetted surface in the wet etching. In range 300–1200 nm, better was achieved with average reflectivity 40 mA) and efficiency (0.1% absolute) has been compared control cell without deterioration other performance parameters (such as open circuit voltage fill factor). Internal quantum measurement also proves lower front recombination velocity based solar cell. believe that improved wetting property prior etching is important for optimizing process, treatment easy integrated industrial mass production.