Drift estimation for single marker switching based imaging schemes

摘要: In recent years, the diffraction barrier in fluorescence imaging has been broken and optical nanoscopes now routinely image with resolutions of down to 20 nm, an improvement more than 10 fold. Because this allows much smaller features because all super-resolution approaches trade off speed for spatial resolution, mechanical instabilities microscopes become a limiting factor. Here, we propose fully data-driven statistical registration method drift detection correction single marker switching (SMS) schemes, including guideline parameter choice quality checks analysis. The necessary assumptions about are minimal, allowing model-free approach, but specific models can easily be integrated. We determine resulting performance on standard SMS measurements show that determination brought range precision achievable by fiducial marker-tracking methods.