Flicker masking depends on the method of measurement

摘要: Abstract Luminance flicker masks sinusoidal gratings of low spatial frequency (SF), the effect being attributed to transiency response within this SF range. An alternative point view is that lower number cycles such makes them more susceptible masking. To verify possibility, masking low-SF (1 c/deg) varying size was studied by methods human visually evoked potentials (VEP), reaction time (RT) and contrast threshold. Difference between effects on threshold, RT VEP found: delayed reduced in amplitude with both small large while threshold only increased gratings. The decrease grating duration Moreover, a unimodal function brief test bimodal one long-lasting It concluded that: 1. (1) previously reported luminance are not an artefact cycles; 2. (2) at tested, depend transient components response, sensitivity depends sustained response.