Electrical size effect in polycrystalline vanadium films

摘要: The electrical size effect of polycrystalline vanadium films evaporated onto molybdenum glass substrates at a temperature 293 K was examined in vacuum 10−10Torrin situ. It has been shown that grain-boundary scattering and additional defects (absorbed foreign atoms) are considerable they cannot be neglected. On the basis electron mean free path for range to 575 found vary from 12.3×10−10 7.7×10−10m.