Noise reduction in atomic force microscopy: Resonance contact mode
作者： S. D. O’Connor , R. C. Gamble , R. K. Eby , J. D. Baldeschwieler
DOI: 10.1063/1.1146602
关键词:
摘要: Noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is contact with surface. The applied excitation (>~200 kHz; ~1 nm) acoustically coupled tip and dampens resonance Q factors of system. frequency well above bandwidth acquisition system (50 kHz). We call this mode "resonance contact" mode. nonlinear behavior tip–sample interaction allows effectively broaden response resonances.
scitation.org
core.ac.uk
harvard.edu
aip.org
sci-hub.se 参考文章(7)
G. Y. Chen, R. J. Warmack, T. Thundat, D. P. Allison, A. Huang, Resonance response of scanning force microscopy cantilevers Review of Scientific Instruments. ,vol. 65, pp. 2532- 2537 ,(1994) , 10.1063/1.1144647
David R. Baselt, Steven M. Clark, Michael G. Youngquist, Charles F. Spence, John D. Baldeschwieler, Digital signal processor control of scanned probe microscopes Review of Scientific Instruments. ,vol. 64, pp. 1874- 1882 ,(1993) , 10.1063/1.1144462
U. Rabe, W. Arnold, Atomic force microscopy at MHz frequencies Annalen der Physik. ,vol. 506, pp. 589- 598 ,(1994) , 10.1002/ANDP.19945060704
Y. Martin, C. C. Williams, H. K. Wickramasinghe, Atomic force microscope–force mapping and profiling on a sub 100‐Å scale Journal of Applied Physics. ,vol. 61, pp. 4723- 4729 ,(1987) , 10.1063/1.338807
D Anselmetti, R Luthi, E Meyer, T Richmond, M Dreier, J E Frommer, H -J Guntherodt, Attractive-mode imaging of biological materials with dynamic force microscopy Nanotechnology. ,vol. 5, pp. 87- 94 ,(1994) , 10.1088/0957-4484/5/2/004
Constant A. J. Putman, Kees O. Van der Werf, Bart G. De Grooth, Niek F. Van Hulst, Jan Greve, Tapping mode atomic force microscopy in liquid Applied Physics Letters. ,vol. 64, pp. 2454- 2456 ,(1994) , 10.1063/1.111597
P. K. Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. E. Hillner, M. Bezanilla, M. Fritz, D. Vie, H. G. Hansma, C. B. Prater, J. Massie, L. Fukunaga, J. Gurley, V. Elings, Tapping mode atomic force microscopy in liquids Applied Physics Letters. ,vol. 64, pp. 1738- 1740 ,(1994) , 10.1063/1.111795