Die bond touch down detector

作者: Ricardo Jorge Silverio de Magalhaes Machado , Andre Gil Martins Cardoso

DOI:

关键词:

摘要: A die bond touch down detector (20) includes a strain gauge circuit (22) having plurality of gauges (12) formed into wheatstone bridge configuration. The are mounted on head (10) and measure detect deformations the (10). generates differential output signal in response to detected by (12). is amplified, filtered, converted digital format for processing microcontroller (36). (36) performs calibration, display formatting, generation. provides real time monitorization, automatic force applied information

参考文章(21)
F Kulicke, J Lepone, Semiconductor die bonder ,(1970)
Seymour H. Raskin, Force measurement device ,(1980)
Jeffrey A. LaPat, George H. Bantz, Multi-head die bonding system ,(1993)
Lee R. Reid, Intelligent multiprobe tip ,(1983)
Michael John Hight, Roy Victor Winkle, John Robert Dale, Ultrasonic bonding apparatus ,(1975)
Charles R. Ratliff, Lee R. Reid, Multiprobe test system and method of using same ,(1978)
John D. Dreibelbis, I. Marvin Weilerstein, Wire bond monitoring system ,(1985)