作者: Josep Altet , Antonio Rubio
DOI: 10.1007/978-1-4757-3635-9_3
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摘要: The goal of this chapter is to present different techniques obtain temperature maps or waveforms at certain areas points an integrated circuit (IC). data we need perform analysis are: description the physical structure IC, thermal properties materials from which it made, placement devices that act as heat sources, its power consumption waveform and, finally, conditions IC’s surroundings, will determine what call boundary conditions.