Thermal analysis in integrated circuits

作者: Josep Altet , Antonio Rubio

DOI: 10.1007/978-1-4757-3635-9_3

关键词:

摘要: The goal of this chapter is to present different techniques obtain temperature maps or waveforms at certain areas points an integrated circuit (IC). data we need perform analysis are: description the physical structure IC, thermal properties materials from which it made, placement devices that act as heat sources, its power consumption waveform and, finally, conditions IC’s surroundings, will determine what call boundary conditions.

参考文章(37)
James Ward Brown, Ruel Vance Churchill, Fourier series and boundary value problems ,(1938)
J. Altet, A. Rubio, E. Schaub, S. Dilhaire, W. Claeys, Thermal coupling in integrated circuits: application to thermal testing IEEE Journal of Solid-state Circuits. ,vol. 36, pp. 81- 91 ,(2001) , 10.1109/4.896232
Horatio Scott Carslaw, John Conrad Jaeger, Conduction of Heat in Solids ,(1959)
K. Poulton, K.L. Knudesn, J.J. Corcoran, K.-C. Wang, R.L. Pierson, R.B. Nubling, M.-C.F. Chang, Thermal design and simulation of bipolar integrated circuits IEEE Journal of Solid-state Circuits. ,vol. 27, pp. 1379- 1387 ,(1992) , 10.1109/4.156441
R. Castello, P. Antognetti, Integrated-circuit thermal modeling IEEE Journal of Solid-state Circuits. ,vol. 13, pp. 363- 366 ,(1978) , 10.1109/JSSC.1978.1051054
Jia Tzer Hsu, L. Vu-Quoc, A rational formulation of thermal circuit models for electrothermal simulation. II. Model reduction techniques [power electronic systems] IEEE Transactions on Circuits and Systems I-regular Papers. ,vol. 43, pp. 733- 744 ,(1996) , 10.1109/81.536743
Vladimir Székely, Thermal monitoring of microelectronic structures Microelectronics Journal. ,vol. 25, pp. 157- 170 ,(1994) , 10.1016/0026-2692(94)90008-6
P. Antognetti, F. Curatelli, G.R. Bisio, S. Palara, Three-dimensional transient thermal simulation: application to delayed short circuit protection in power ICs IEEE Journal of Solid-state Circuits. ,vol. 15, pp. 277- 281 ,(1980) , 10.1109/JSSC.1980.1051383
B. Young, A.K. Sparkman, Measurement of package inductance and capacitance matrices IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B. ,vol. 19, pp. 225- 229 ,(1996) , 10.1109/96.486506