摘要: PEEM is one of the imaging type photoelectron microscopy (Kinoshita et al. in J Phys Soc Jpn 82 2013 [1]). The apparatus equipped with some electrostatic lens systems, a microchannel plate (MCP) and fluorescent screen. When excitation photons are injected onto sample, photoelectrons including secondary electrons emitted. systems magnify focus images spatial distributions these from sample MCP. Then screen illuminated by amplified electrons. By using charge coupled device (CCD) camera, magnified image emitted electron surface can be obtained. mercury lamp or deuterium used as an source, distribution local work function becomes visible, since photon energy about 4 eV.
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