A novel method for defect location using Iddq

作者: Xu Burong , Xu Hongbing , Deng Ying , Wang Houjun

DOI: 10.1109/ICCCAS.2004.1346416

关键词:

摘要: A novel algorithm for fault location using Iddq has been presented in this paper. significant advantage of method is that it can effectively locate multiple defects a circuit. An experiment used to illuminate discussed detail.

参考文章(12)
P. Nigh, D. Forlenza, F. Motika, Application and analysis of IDDQ diagnostic software international test conference. pp. 319- 327 ,(1997) , 10.1109/TEST.1997.639633
E. Isern, J. Figueras, I/sub DDQ/ test and diagnosis of CMOS circuits IEEE Design & Test of Computers. ,vol. 12, pp. 60- 67 ,(1995) , 10.1109/54.491239
P. Nigh, W. Maly, Test generation for current testing (CMOS ICs) IEEE Design & Test of Computers. ,vol. 7, pp. 26- 38 ,(1990) , 10.1109/54.46891
M. Liu, S. Chakravarty, Algorithms for current monitor based diagnosis of bridging and leakage faults design automation conference. pp. 353- 356 ,(1992) , 10.5555/113938.149486
P. Nigh, W. Maly, Test generation for current testing [1989] Proceedings of the 1st European Test Conference. pp. 194- 200 ,(1989) , 10.1109/ETC.1989.36243
H. Cox, J. Rajski, A method of fault analysis for test generation and fault diagnosis IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. ,vol. 7, pp. 813- 833 ,(1988) , 10.1109/43.3952
R.C. Aitken, Fault Location with Current Monitoring international test conference. pp. 623- 632 ,(1991) , 10.1109/TEST.1991.519726
R. Rajsuman, Iddq Testing for CMOS VLSI ,(1994)
R.C. Aitken, A comparison of defect models for fault location with Iddq measurements international test conference. pp. 778- 787 ,(1992) , 10.1109/TEST.1993.470593
S. Chakravarty, S.T. Zachariah, STBM: a fast algorithm to simulate I/sub DDQ/ tests for leakage faults IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. ,vol. 19, pp. 568- 576 ,(2000) , 10.1109/43.845081