作者: Xu Burong , Xu Hongbing , Deng Ying , Wang Houjun
DOI: 10.1109/ICCCAS.2004.1346416
关键词:
摘要: A novel algorithm for fault location using Iddq has been presented in this paper. significant advantage of method is that it can effectively locate multiple defects a circuit. An experiment used to illuminate discussed detail.