Application and analysis of IDDQ diagnostic software
作者： P. Nigh , D. Forlenza , F. Motika
关键词:
摘要: A current disadvantage of IDDq testing is lack software-based diagnostic tools that enable IC vendors to create a large database defects uniquely detected with this test method. We present methodology for performing defect localization based upon information (only). Using technique, fault can be completed within minutes (e.g. <5 minutes) after complete. This technique supports multiple models and has been successfully applied number samples-including ones have verified through failure analysis. Data presented related key issues such as resolution, hardware-to-fault model correlation, thresholds, the diagnosability various types.
ieeecomputersociety.org参考文章(28)
Stephen Y. H. Su, Yashwant K. Malaiya, A New Fault Model and Testing Technique for CMOS Devices. international test conference. pp. 25- 34 ,(1982)
A.E. Gattiker, W. Maly, Current signatures [VLSI circuit testing] vlsi test symposium. pp. 112- 117 ,(1996) , 10.1109/VTEST.1996.510844
S.D. Millman, J.M. Acken, Diagnosing CMOS bridging faults with stuck-at, IDDQ, and voting model fault dictionaries custom integrated circuits conference. pp. 409- 412 ,(1994) , 10.1109/CICC.1994.379692
Jerry M. Soden, Charles F. Hawkins, Alan W. Righter, F. Joel Ferguson, Defect Classes - An Overdue Paradigm for CMOS IC international test conference. pp. 413- 425 ,(1994)
F Joel Ferguson, Tracy Larrabee, Test Pattern Generation for Realistic Bridge Faults in CMOS ICs international test conference. pp. 492- 499 ,(1991) , 10.1109/TEST.1991.519711
John M. Acken, Testing for Bridging Faults (Shorts) in CMOS Circuits design automation conference. pp. 717- 718 ,(1983) , 10.5555/800032.800749
Sreejit Chakravarty, Minsheng Liu, Algorithms for I DDQ measurement based diagnosis of bridging faults Journal of Electronic Testing. ,vol. 3, pp. 377- 385 ,(1992) , 10.1007/BF00135341
V Champac, J Figueras, R Rodriguez, R Rodríguez-Montañés, A Rubio, J Segura, Quiescent current analysis and experimentation of defective CMOS circuits Journal of Electronic Testing. ,vol. 3, pp. 337- 348 ,(1992) , 10.1007/BF00135337
P.C. Maxwell, V. Johansen, Inshen Chiang, Functional and scan tests: The effectiveness of I/sub DDQ/ how many fault coverages do we need? international test conference. pp. 168- 168 ,(1992) , 10.1109/TEST.1992.527817
Robert C. Aitken, Diagnosis of leakage faults with I DDQ Journal of Electronic Testing. ,vol. 3, pp. 367- 375 ,(1992) , 10.1007/BF00135340