Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions
作者： P. Nigh , A. Gattiker
DOI: 10.1109/TEST.2004.1386966
关键词:
摘要: This work demonstrates IDDQ signature analysis of random and systematic defects, including yield detractors reliability defects. Application is demonstrated for both understanding failure root cause guiding test decisions. signatures contain rich information about the circuit, defect behavior processing conditions. paper describes capturing that by classifying into different categories using classifications to learn nature defects occuring on a variety ASIC chips.
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Barry R. Allen, Test and Reliability Springer, Dordrecht. pp. 251- 273 ,(1996) , 10.1007/978-94-009-1630-2_11
B. Kruseman, R. van Veen, K. van Kaam, The future of delta I/sub DDQ/ testing international test conference. pp. 101- 110 ,(2001) , 10.1109/TEST.2001.966623
A.E. Gattiker, W. Maly, Current signatures [VLSI circuit testing] vlsi test symposium. pp. 112- 117 ,(1996) , 10.1109/VTEST.1996.510844
Chung-Yuan Tsao, R.Y. Shiue, C.C. Ting, Y.S. Huang, Y.C. Lin, J.T. Yue, Applying dynamic voltage stressing to reduce early failure rate international reliability physics symposium. pp. 37- 41 ,(2001) , 10.1109/RELPHY.2001.922878
S.D. Millman, J.M. Acken, Diagnosing CMOS bridging faults with stuck-at, IDDQ, and voting model fault dictionaries custom integrated circuits conference. pp. 409- 412 ,(1994) , 10.1109/CICC.1994.379692
Jerry M. Soden, Charles F. Hawkins, Alan W. Righter, F. Joel Ferguson, Defect Classes - An Overdue Paradigm for CMOS IC international test conference. pp. 413- 425 ,(1994)
P. Nigh, D. Forlenza, F. Motika, Application and analysis of IDDQ diagnostic software international test conference. pp. 319- 327 ,(1997) , 10.1109/TEST.1997.639633
A.C. Miller, I/sub DDQ/ testing in deep submicron integrated circuits international test conference. pp. 724- 729 ,(1999) , 10.1109/TEST.1999.805801
C. Thibeault, An histogram based procedure for current testing of active defects international test conference. pp. 714- 723 ,(1999) , 10.1109/TEST.1999.805800
M. Rodgers, Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors international test conference. pp. 464- 467 ,(2000) , 10.1109/TEST.2000.894238