Deterministic IDDQ diagnosis using a net activation based model
作者： Andras Kun , Ralf Arnold , Peter Heinrich , Guenole Maugard , Huaxing Tang
DOI: 10.1109/TEST.2011.6139175
关键词: Code coverage 、 Volume (computing) 、 Automation 、 Automotive industry 、 Iddq testing 、 Real-time computing 、 Test method 、 Automatic test pattern generation 、 Engineering 、 CMOS 、 Reliability engineering
摘要: In Automotive business, the quiescent supply current test (IDDQ) is a widely used and valuable method to screen out production failures reach required low defective parts per million (DPPM) quality targets. Automatic Test Pattern Generation (ATPG) tools can generate scan based IDDQ patterns with high coverage for Pseudo Stuck-At (PSA) faults. Functional pass but failing devices need be diagnosed various purposes. this paper fast simulation proposed diagnose single or multiple defects digital circuitry. The results are verified on real silicon several 130nm designs. Furthermore automation of diagnosis volume similar shown in outlook.
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