Advancements in diagnosis driven yield analysis (DDYA): A survey of state-of-the-art scan diagnosis and yield analysis technologies
作者： Yu Huang , Wu Yang , Wu-Tung Cheng , None
关键词: System on a chip 、 State (computer science) 、 Reliability engineering 、 Production (economics) 、 Statistical analysis 、 Automatic test pattern generation 、 Root cause 、 Yield (finance) 、 Engineering 、 Profit margin
摘要: For advanced technology, the current industry is seeing very complicated silicon defect types and distribution. It common for yield of a new design to start at low level it's critical ramp up as quickly possible meet market window. During manufacturing stage volume production, excursions do occur needs be improved stabilized level. also great interest people increase high so that they can improve profit margin. In all these scenarios, diagnosis statistical analysis help identify root cause defects, which success improvements.
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