Current signatures: application [to CMOS]
作者： A.E. Gattiker , W. Maly
关键词:
摘要: Analysis of IC technology trends indicates that Iddq testing may be approaching its limits applicability. The new concept the current signature expand this limit under condition an appropriate current-signature-based test methodology is developed. This paper a first step toward such goal. It focused on detection in noisy environment. Application signatures die selection and defect diagnosis discussed as well.
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