Evaluation of the Iddq Signature in devices with Gauss-distributed background current

摘要: In the last decade, single-threshold IDDQ approach made way for more elaborated techniques like Delta-IDDQ and adaptive IDDQ. Due to increasing background currents, however, also these methods are beginning have problems distinguish between good bad devices. A evaluation algorithm takes all known information about 'good' 'bad' parts into account, i.e. it 'knows' how signatures of look like. Unfortunately, not only do differ significantly, but even more. Moreover, since faults often than non-fatal (not impairing functionality), is frequently hard say if a device really or bad'. There two kinds information, which without referring certain process IC type: one model fault, other statistical distribution background-IDDQ. Using this an estimator with higher discrimination capability traditional Delta-IDDQ-approach created. Measurement results form several lots 180 nm chip presented..