Determination of trace impurities in tantalum oxide and niobium oxide by laser ablation inductively coupled plasma mass spectrometry

摘要: Methods have been developed for the determination of trace impurities in high-purity tantalum and niobium oxides by laser ablation inductively coupled plasma mass spectrometry. Sample preparation is quick simple, as no dissolution or separation from matrix necessary. The limits detection are less than 1 µg g–1 most elements, relative standard deviations order 0.15. Problems experienced with technique, i.e., memory effects poor reproducibility data acquisition, discussed.