Robust variable keeper strength process-compensated dynamic circuit and method
作者： Chris Hyung-il Kim , Steven K. Hsu , Ram Krishnamurthy
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摘要: A variable keeper strength based process-compensated dynamic circuit and method provides a robust digital way to overcome the intrinsic parameter variation present in manufactured dies. Using circuit, wide robustness delay distribution becomes narrower which improves performance without sacrificing worst-case robustness. The of is programmed depending on amount die leakage. will have an optimal for best worst case leakage, allowing better with improved
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