作者: Ersin Kayahan , Hasan Oktem , Fikret Hacizade , Humbat Nasibov , Ozcan Gundogdu
DOI: 10.1016/J.TRIBOINT.2009.06.010
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摘要: Abstract In this paper, results from an optical technique for measuring surface roughness using image analysis of speckle pattern images are presented. The coined as statistical properties binary (SPBI) utilizes the combined effects and scattering phenomena. patterns obtained with a He–Ne laser were binarized examined. parameters such bright dark regions their ratios model to evaluate compared parameter R profilometer. It was found that there is strong relationship between these , especially in range λ where wavelength. Although, it relative method, has great potential be used in-process measurement automation due simplicity system used. proposed method non-contact applied samples 0.5825 1.9 μm steel (CK 45) through CNC face-milling process.