Guided test generation for isolation and detection of embedded trojans in ics

摘要: Testing the genuineness of a manufactured chip is an important step in IC product life cycle. This becomes more prominent with outsourcing manufacturing process, since manufacturer may tamper internal circuit behavior using Trojan circuits original design. Traditional testing methods cannot detect these stealthy Trojans because triggering scenario, which activates it, unknown. Recently, approaches based on side-channel analysis have shown promising results detecting Trojans. In this paper, we propose novel test generation technique that aims at magnifying disparity between signal waveforms tampered and genuine to indicate possibility tampering. Experimental our approach could magnify likelihood 4 20 times than existing approaches.