作者: M. Bart , E. W. M. van der Ham , P. Saunders
DOI: 10.1007/S10765-007-0251-6
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摘要: This article introduces a new technique for measuring the size-of-source effect in radiation thermometers. It is based on scanning thermometer across an aperture and extracting data from residual signal, similar to commonly used indirect method. The method has several advantages including speed, ability cover wide angles, amenability automation, at expense of some added mathematical complexity. Results compare favorably with frequently effect.